Atomic force microscopy (AFM) for scientists
You are likely familiar with techniques such as optical microscopy and scanning electron microscopy (SEM) for imaging at the micron and nanometer scale, respectively. What about atomic force microscopy? Learn about how it works, and its versatility and uses.
The superiority of conical tips in atomic force microscopy (AFM)
The shape of AFM tips is an important consideration in AFM imaging, with the most common shapes being conical, pyramidal, and tetrahedral. Learn about the advantages of conical tips over the other two types.
Reflective coating of the cantilever in atomic force microscopy (AFM)
The backside of a cantilever may be coated in metal to increase reflection of the laser and thus, its signal on reaching the photodetector. Learn about the different types of coating and when they should and shouldn't be used.
Improving image resolution with high aspect ratio (HAR) atomic force microscopy (AFM) probes
The aspect ratio of an AFM tip is the ratio of its height to its width. Learn about how increasing the aspect ratio of the tip can improve image resolution for non-planar surface structures such as trenches and how a high aspect ratio is achieved in practice.
Vertical probes in Lateral Molecular Force Microscopy (LMFM)
Most commonly, AFM probes are horizontally mounted to facilitate AFM imaging, which leads to some limitations. These can be overcome by the use of vertically orientated probes in a technique known as Lateral Molecular Force Microscopy. Learn about this technique and the advantages of vertically orientated probes.
