Insulating MgO sample, lithographically modified by trapping electrical charge using a tip bias voltage, and subsequently imaged by KPFM. Both lithography and imaging using a Spark 350 Pt probe in an NT-MDT Ntegra AURA.
Image courtesy of Dr Héctor Corte-León, National Physical Laboratory
Strained MBE graphene grown on hBN flakes exfoliated on a sapphire substrate (carbon aggregates across the sapphire provide a conductive substrate/connection to graphene) recorded with the NuNano Spark 70 Pt probe. All images recorded with an Asylum Research Cypher S AFM under ambient conditions. A negative bias of -5mV was used for all images.
Image courtesy of James Thomas & Prof. Peter Beton, University of Nottingham
C60 nanostructures clustered on the step edges of a pentacene layer. Imaged using Scout 350R probes in tapping mode with an Agilent SPM 5500 system. (Image size: 2 x 2 μm, z-scale: 1.5 μm) A paper has been published on this work.
Image courtesy of Ms. Andrea Huttner, Dr. Tobias Breuer, and Prof. Dr. Gregor Witte, University of Marburg, Germany.
Micro-street map of self-organised microstructures on a flat substrate. Imaged using Scout 350R probes in PeakForceTapping® mode with a Bruker Multimode 8 AFM. (Image size: 100 x 100 μm, z-scale: 240 nm)
Image courtesy of Dr. Georg Haehner and Mr. David Jones, University of St. Andrews, UK.
Amplitude image of plumbers PTFE tape acquired with AC mode in air using a JPK NanoWizard® Ultra and a Scout 70R probe.The thin features oriented from bottom left to top right are the PTFE molecules, spaced by 0.5-0.75 nm depending on the crystal orientation.
Image courtesy of Dr Nic Mullin, University of Sheffield, UK
Heptacene-based island-like crystallites grown on Al2O3. Imaged using Scout 350 probes in AC mode with a Digital Instruments Nanoscope III AFM (Image size: 5 x 5 μm, z-scale: 10 nm)
Image courtesy of Dr Aleksandar Matkovic, Aydan Çiçek, Dr Markus Kratzer & Prof Dr Christian Teichert, Montanuniversität Leoben, Austria.
Poly(3-hexyl thiophene) semiconducting nanofibers deposited by spin coating on silicon. Imaged using a Scout 350 AFM probe in AC mode with a Bruker Dimension 3100 AFM. (z-scale: 20 nm)
Image courtesy of Dr Piotr Wolanin, Prof. Charl Faul & Prof. Ian Maners, University of Bristol, UK.