Amplitude image of plumbers PTFE tape acquired with AC mode in air using a JPK NanoWizard® Ultra and a Scout 70R probe.The thin features oriented from bottom left to top right are the PTFE molecules, spaced by 0.5-0.75 nm depending on the crystal orientation.
Image courtesy of Dr Nic Mullin, University of Sheffield, UK
SRAM test structures
Semiconductor-processed silicon wafers with SRAM test structures. Images acquired using Scout 70R AFM probes in PeakForce Tapping® on a Bruker Dimension Edge AFM. (Image size: 50 x 50 μm, z-scale: 900 nm)
Image courtesy of Dr Filip Gucmann, University of Bristol, UK.
Film of cellulose nanofibrils (CNF) spin-coated onto mica. Imaged using Scout 350R probes in AC mode with a Bruker Multimode 8 AFM (z-scale: 50 nm).
Image courtesy of Dr Juan José Valle-Delgado, Aalto University, Finland
High resolution imaging of C60 on gold
Approx 2 ML C60 on Au (111) imaged using a Scout 350R probe in AC (tapping) mode in ambient environment on an Asylum Research Cypher AFM.
Images courtesy of Dr Vladimir Korolkov & Prof. Peter Beton, University of Nottingham, UK.
Poly(3-hexyl thiophene) semiconducting nanofibers deposited by spin coating on silicon. Imaged using a Scout 350 AFM probe in AC mode with a Bruker Dimension 3100 AFM. (z-scale: 20 nm)
Image courtesy of Dr Piotr Wolanin, Prof. Charl Faul & Prof. Ian Maners, University of Bristol, UK.
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