SABRE 300 - Silicon AFM probe

Cantilever - 30 deg Final flipped fixed.png
Tip - 45 deg Final.png
Cantilever - 30 deg Final flipped fixed.png
Tip - 45 deg Final.png

SABRE 300 - Silicon AFM probe

from £270.00

High quality silicon AFM probes for non-contact/tapping modes in air with the tip positioned at the very end of the cantilever. Available uncoated or with an aluminium or gold reflective backside coating. We also offer SEM images of each individual tip.

Spring constant: 32 N/m

Resonant frequency: 300 kHz

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Cantilever Specifications

Parameter Nominal Range
Spring constant (N/m) 32 20 - 55
Resonant frequency (kHz) 300 250 - 350
Shape Rectangular
Length (µm) 160 157 - 163
Width (µm) 40 36 - 44
Thickness (µm) 4.5 4.0 - 5.0
Material Silicon (n-type, Antimony)
Resistivity (Ωcm) 0.02 0.015 - 0.025

NB. Nominal values for spring constants and resonant frequencies are calculated using well known formulae and based on expected probe dimensions. The ranges are calculated using measured dimensions.

Tip Specifications

Parameter Nominal Range
Radius (nm) 5 < 10
Height (µm) 14 12 - 16
Set back (µm) none
Shape Tetrahedral
Cone Angle (°) 25 10 - 40
Material Silicon (n-type, Antimony)
Resistivity (Ωcm) 0.02 0.015 - 0.025

Optional Reflective Coatings

Uncoated (SABRE 300): Frontside/Tip - None, Backside/Reflective - None

Aluminium (SABRE 300 RAl): Frontside/Tip - None, Backside/Reflective - 40 nm Al

Gold (SABRE 300 RAu): Frontside/Tip - None, Backside/Reflective - 5 nm Ti, 40 nm Au

Disclaimer

At NuNano we continually strive to develop and improve our products. Consequently, Nu Nano Ltd reserves the right to change specifications without notice.

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