SENSE 100 - Silicon nitride AFM probe
SENSE 100 - Silicon nitride AFM probe
Benefit from high quality imaging with our pack of 10 general purpose silicon nitride AFM probes, suitable for imaging soft samples using contact or AC mode in either air or liquid. They feature a sharp silicon tip integrated onto a silicon nitride cantilever with a gold reflective backside coating.
Spring constant: 0.1 N/m
Resonant frequency: 100 kHz
For bulk orders, quotation requests, or to pay in Euros/USD:
Cantilever Specifications
| Parameter | Nominal | Range |
| Spring constant (N/m) | 0.1 | 0.07 - 0.12 |
| Resonant frequency (kHz) | 100 | 80 - 120 |
| Shape | Rectangular | |
| Length (µm) | 38 | 37 - 39 |
| Width (µm) | 16 | 15 - 17 |
| Thickness (µm) | 0.2 | 0.18 - 0.22 |
| Material | Silicon nitride |
NB. Nominal values for spring constants and resonant frequencies are calculated using well known formulae and based on expected probe dimensions. The ranges are calculated using measured dimensions.
Tip Specifications
| Parameter | Nominal | Range | |
| Radius (nm) | 5 | < 10 | |
| Height (µm) | 7 | 5 - 8 | |
| Shape | Tetrahedral | ||
| Material | Silicon (n-type, Antimony) | with protective SiN neck |
Coating
Frontside/Tip
None
Backside/Reflective
5 nm Ti
40 nm Au
Disclaimer
At NuNano we continually strive to develop and improve our products. Consequently, Nu Nano Ltd reserves the right to change specifications without notice.
Please see our privacy policy for how we use your data.