Reliable imaging every time

Rigorous inspection of every probe means each one performs as you expect.

At NuNano we are passionate about supplying our customers with the best possible products. We do our utmost to ensure every probe meets your expectations.

Silicon AFM (atomic force microscopy) probe tip

SCOUT

Our silicon AFM probes

Nominal 5 nm tip radius. Minimal variation in spring constant and resonant frequency. Metallic coatings available.

Tipless silicon nitride AFM (atomic force microscopy) probe showing chip and cantilever

QUEST

Our tip-less silicon nitride probes

Rectangular and triangular geometry available. Minimal variation in spring constant and resonant frequency.

Conductive AFM (atomic force microscopy) probe featuring cantilever and tip

SPARK

Our conductive AFM probes

40 nm platinum coating with 5 nm titanium adhesion layer on both sides of the probe. Tip radius < 30 nm.

SENSE

Our tipped silicon nitride probes

Triangular probes with integrated silicon tip and gold reflective backside coating.

Choose your AFM Probes

Customers’ Images

NuNano’s range of high quality AFM probes allow scientists from many disciplines to reliably image their samples. Browse examples of images our customers have taken in our image gallery.

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